湘潭大學(xué)機(jī)械工程學(xué)院導(dǎo)師:鄭學(xué)軍

發(fā)布時(shí)間:2021-11-20 編輯:考研派小莉 推薦訪問(wèn):
湘潭大學(xué)機(jī)械工程學(xué)院導(dǎo)師:鄭學(xué)軍

湘潭大學(xué)機(jī)械工程學(xué)院導(dǎo)師:鄭學(xué)軍內(nèi)容如下,更多考研資訊請(qǐng)關(guān)注我們網(wǎng)站的更新!敬請(qǐng)收藏本站,或下載我們的考研派APP和考研派微信公眾號(hào)(里面有非常多的免費(fèi)考研資源可以領(lǐng)取,有各種考研問(wèn)題,也可直接加我們網(wǎng)站上的研究生學(xué)姐微信,全程免費(fèi)答疑,助各位考研一臂之力,爭(zhēng)取早日考上理想中的研究生院校。)

湘潭大學(xué)機(jī)械工程學(xué)院導(dǎo)師:鄭學(xué)軍 正文

[導(dǎo)師姓名]
鄭學(xué)軍

[所屬院校]
湘潭大學(xué)

[基本信息]
導(dǎo)師姓名:鄭學(xué)軍
性別:男
人氣指數(shù):2563
所屬院校:湘潭大學(xué)
所屬院系:機(jī)械工程學(xué)院
職稱:教授
導(dǎo)師類型:博導(dǎo)
招生專業(yè):
研究領(lǐng)域:1、低維納米材料及其敏感器件2、半導(dǎo)體納米結(jié)構(gòu)及微納光機(jī)電系統(tǒng)3、壓電材料及傳感元器件4、...

[通訊方式]
辦公電話:073158293210
電子郵件:zhengxuejun@xtu.edu.cn

[個(gè)人簡(jiǎn)述]
“薄膜材料及其器件力學(xué)” 湘潭大學(xué)首個(gè)教育部創(chuàng)新團(tuán)隊(duì)帶頭人(2010),“低維材料及其器件力學(xué)”湖南省高校科技創(chuàng)新團(tuán)隊(duì)帶頭人(2009),教育部長(zhǎng)江學(xué)者特聘教授(2009),國(guó)家杰出青年基金(2008),湖南省芙蓉學(xué)者特聘教授(2007)。全國(guó)百篇優(yōu)博論文提名獎(jiǎng)(2005)。美國(guó)匹茲堡大學(xué)訪問(wèn)學(xué)者(2005),湘潭大學(xué)一般力學(xué)與力學(xué)基礎(chǔ)博士(2002), 中南大學(xué)橋隧結(jié)構(gòu)工程碩士(1989),國(guó)防科大飛行器固體力學(xué)本科(1985)。1985年7月-2003年6月,中南大學(xué)鐵道學(xué)院任助教、講師、副教授。2003年6月-2014年10月,湘潭大學(xué)教授、博士生導(dǎo)師,2006年10月-2014年10月,任湘潭大學(xué)材料與光電物理學(xué)院副院長(zhǎng)。2003年6月-2011年10月,任湘潭大學(xué)“低維材料及其應(yīng)用技術(shù)教育部重點(diǎn)實(shí)驗(yàn)室 ”副主任。2014年10月至今,任湘潭大學(xué)機(jī)械工程學(xué)院學(xué)院院長(zhǎng)。

[科研工作]
已主持完成的科研項(xiàng)目:
1、上海市科委納米專項(xiàng)(11nm0502600) , 2011-2014年。2、低維鐵電材料的制備、力學(xué)表征及其微器件應(yīng)用,國(guó)家自然科學(xué)基金項(xiàng)目杰出青年基金(10825209), 2008-2012年。3、鈦酸鉍鈉基弛豫型無(wú)鉛壓電薄膜及相關(guān)性能,國(guó)家自然科學(xué)基金項(xiàng)目(50872117), 2009-2011年。4、自組裝半導(dǎo)體壓電納米帶及相關(guān)性能,國(guó)家自然科學(xué)基金項(xiàng)目(10672139), 2007-2009年。5、ZnO, ZnS壓電納米帶及物理力學(xué)性能,國(guó)家教育部和湖南省教育廳重點(diǎn)項(xiàng)目,2007-2009年。6、自組裝半導(dǎo)體壓電納米帶及相關(guān)力學(xué)性能,國(guó)家自然科學(xué)基金(10672139), 2007-2009年。7、無(wú)鉛鐵電薄膜及其納米薄膜微器件,湖南省科技計(jì)劃重點(diǎn)項(xiàng)目,2005-2007年。8、鉍層狀鈣鈦礦鐵電薄膜的制備及其熱沖擊下斷裂失效行為(10472099),國(guó)家自然科學(xué)基金項(xiàng)目,2005-2007年。9、壓電薄膜材料的制備及相關(guān)物理力學(xué)性能,湖南省教育廳青年骨干教師基金項(xiàng)目,2003-2005年。10、壓電薄膜材料的制備及相關(guān)物理力學(xué)性能,湖南省教育廳青年項(xiàng)目,2003-2005年。
在研主持科研項(xiàng)目:
1、GaN半導(dǎo)體納米材料的多場(chǎng)耦合失效機(jī)理(編號(hào):51272158), 2013-2016年。2、薄膜材料及其器件力學(xué) 教育部“長(zhǎng)江學(xué)者計(jì)劃”獎(jiǎng)勵(lì)計(jì)劃 教育部創(chuàng)新團(tuán)隊(duì)滾動(dòng)資助項(xiàng)目(IRT_14R48)3、薄膜材料及器件力學(xué),教育部“長(zhǎng)江學(xué)者計(jì)劃”特聘教授項(xiàng)目([2009]17)
發(fā)明專利
1、基于單個(gè)極性半導(dǎo)體納米帶光彈簧的制作方法 鄭學(xué)軍、陳義強(qiáng)、王甲世、姜傳斌、龔倫軍 國(guó)家發(fā)明專利, ZL 10030575.2, 20112、一種測(cè)量納米材料光致硬化性能的方法 鄭學(xué)軍、王甲世、陳義強(qiáng)、楊博、龔倫軍 國(guó)家發(fā)明專利, ZL 10030576.7, 20113、一種實(shí)時(shí)測(cè)量納米材料光致伸縮性能的方法 鄭學(xué)軍、陳義強(qiáng)、王甲世、龔倫軍、余功成 國(guó)家發(fā)明專利, ZL 10030573.3, 20124、一種測(cè)量壓電材料壓電系數(shù)d15的準(zhǔn)靜態(tài)方法 鄭學(xué)軍、彭金峰、劉勛、張勇、孫靜 國(guó)家發(fā)明專利, ZL 10035079.7, 20155、一種氧化鋅納米線生長(zhǎng)所用的催化劑及其應(yīng)用,王現(xiàn)英、謝澍梵、鄭學(xué)軍 中國(guó)專利號(hào):ZL 201210008229.0,20146、氧化物稀磁半導(dǎo)體/鐵電體異質(zhì)結(jié)構(gòu)及其制備方法 王金斌、何春、鐘向麗、周益春、鄭學(xué)軍 國(guó)家發(fā)明專利, ZL 101262040, 2010
成果獲獎(jiǎng)
1、薄膜材料及其器件力學(xué) 教育部“長(zhǎng)江學(xué)者計(jì)劃”獎(jiǎng)勵(lì)計(jì)劃 教育部創(chuàng)新團(tuán)隊(duì)滾動(dòng)資助項(xiàng)目2014 (排名第一)2、微納材料及器件的力學(xué)理論設(shè)計(jì)與性能表征方法,湖南省自然科學(xué)二等獎(jiǎng)2013 (排名第一)3、無(wú)鉛鐵電薄膜及其器件的失效與性能調(diào)制,湖南省自然科學(xué)一等獎(jiǎng)2012 (排名第二)4、指導(dǎo)碩士研究生王甲世獲湖南省優(yōu)秀碩士學(xué)位論文(2012)5、指導(dǎo)碩士研究生鄭輝獲“湘潭大學(xué)第十六屆研究生校長(zhǎng)優(yōu)秀獎(jiǎng)”(2011)6、薄膜材料及其器件力學(xué) 教育部“長(zhǎng)江學(xué)者計(jì)劃”獎(jiǎng)勵(lì)計(jì)劃 教育部創(chuàng)新團(tuán)隊(duì)2010 (排名第一)7、低維材料及其器件力學(xué) 湖南省高校創(chuàng)新團(tuán)隊(duì)2010 (排名第一)8、薄膜材料及器件力學(xué),教育部“長(zhǎng)江學(xué)者計(jì)劃”特聘教授項(xiàng)目20099、低維無(wú)機(jī)非金屬材料及微器件,湖南省“芙蓉學(xué)者計(jì)劃”特聘教授項(xiàng)目2007 10、摻銪含量對(duì)Bi4-xEuxTi3 O12鐵電薄膜微結(jié)構(gòu)和鐵電性能的影響,湖南省自然科學(xué)優(yōu)秀學(xué)術(shù)論文一等獎(jiǎng) 2008(排名第一)11、壓電薄膜的斷裂韌性及激光作用下的破壞機(jī)制,全國(guó)100篇優(yōu)秀博士學(xué)位論文提名獎(jiǎng)200512、湖南省優(yōu)秀博士畢業(yè)論文 湖南省人民政府學(xué)位委員會(huì)湖南省教育廳 200513、納米壓痕實(shí)驗(yàn)測(cè)量Pb(Zr0.52Ti0.48)03鐵電薄膜的界面強(qiáng)度,湖南省自然科學(xué)優(yōu)秀學(xué)術(shù)論文一等獎(jiǎng)2004(排名第一)14、湘潭市2001-2003年度自然科學(xué)優(yōu)秀學(xué)術(shù)論文一等獎(jiǎng) 湘潭市科學(xué)技術(shù)協(xié)會(huì) 湘潭市人事局 2004(排名第一)15、材料力學(xué)計(jì)算機(jī)輔助教學(xué)的研究與實(shí)踐 湖南省優(yōu)秀教學(xué)成果二等獎(jiǎng) 1997.7(排名第三)18、L. L Wang, X. J. Luo, X. J. Zheng*, R. Wang and T. Zhang. Direct annealing of electrospun synthesized high-performance porous SnO2 hollow nanofibers for gas sensors, RSC Adv. 3 (2013), 9723-9728 (SCI源刊,影響因子2.562)19、Yanchao She, Xuejun Zheng, Denglong Wang, and Weixi Zhang. Controllable double tunneling induced transparency and solitons formation in a quantum dot molecule. Optics Express 21 (2013), 17392-17403. (SCI源刊,影響因子3.546)20、Y. Wei, H. B. Cheng, X. Y. Wang, and X. J. Zheng. Evaluation on residual stress in Bi3.15(Eu0.7Nd0.15)Ti3O12 polycrystalline ferroelectric thin film by using the orientation average method. Applied Physics Letters, 101, 901-909 (2012). (SCI源刊,影響因子3.82)21、Y. Wei, L. H. Xu, Y. W. Tao, X. J. Zheng, J. H. Yang, D. F. Zou, and S. X. Mao. Width-to-thickness ratio dependence on photoplastic effect of ZnS nanobelt. Applied Physics Letters, 101, 901-904 (2012). (SCI源刊,影響因子3.82) 22、L. H. Xu, D. D. Jiang, and X. J. Zheng. Effect of grain orientation in x-ray diffraction pattern on residual stress in polycrystalline ferroelectric thin film. Journal of Applied Physics 112, 513-521 (2012). (SCI源刊,影響因子2.497)23、X. Liu, X.J. Zheng, J.Y. Liu, K.S. Zhou, D.H. Huang. Effect of annealing temperature on the electrostrictive properties of 0.94(Na0.5Bi0.5)TiO3-0.06BaTiO3 thin films. Journal of Electroceramics, 29(3) (2012), 270-276. (SCI源刊,影響因子1.194)24、S.T. Song, X.J. Zheng, H. Zheng, W. Liu. Evaluation of engineering/ piezoelectric constants of piezoelectric thin film by combining nanoindentation test with FEM. Computational Materials Science, 63 (2012), 134-144. (SCI源刊,影響因子1.522)25、Y. Zhang, X. J. Zheng, X. L. Zhong and S. F. Deng. The ethanol sensing characteristics of ZnO thin films with low operating temperatures synthesized by pulsed laser deposition. Measurement Science and Technology, 23 (2012), 105-107. (SCI源刊,影響因子1.352)26、S.T. Peng, X.J. Zheng, J. Sun, Y. Zhang, L. Zhou, J. H. Zhao, S. F. Deng, M. F. Cao, W. Xiong, K. Peng. Modeling of a micro-cantilevered piezo-actuator considering the buffer layer and electrodes. J. Micromech. Microeng. 22 (2012), 065-075. (SCI源刊,影響因子2.105)27、J. H. Zhao, X. J. Zheng, L. Zhou, Y. Zhang , J. Sun, W.J. Dong, S.H. Deng, S.T. Peng. Investigation of a d15 mode PZT-51 piezoelectric energy harvester with a series connection structure. Smart Mater. Struct. 21 (2012), 105-109. (SCI源刊,影響因子2.089).28、Y. Q. Gong, H. Dong, X. J. Zheng, J. F. Peng, X. J. Li, R. J. Huang. Large piezoelectric response of Bi0.5(Na(1?x)Kx)0.5TiO3 thin films near morphotropic phase boundary identified by multi-peak fitting. J. Phys. D: Appl. Phys. 45 (2012), 301-305. (SCI源刊,影響因子2.544)29、L. Zhou, J. Sun, X. J. Zheng, S. F. Deng, J. H. Zhao, S. T. Peng. Y. Zhang, X. Y. Wang and H. B. Cheng. A model for the energy harvesting performance of shear mode piezoelectric cantilever, Sensors and Actuators A. 179 (2012), 185-192. (SCI源刊,影響因子1.802)30、J. Sun, X. J. Zheng, W. Li, A model for the electrical characteristics of metal-ferroelectric-insulator-semiconductor field-effect transistor. Current Applied Physics, 12(2012), 760-764.31、Y. Zhang, X.J. Zheng, X. L. Zhong, S. F. Deng. The ethanol sensing characteristics of ZnO thin films with low operating temperatures synthesized by pulsed laser deposition. Meas. Sci. Technol. 23(2011),105-107.32、X. J. Zheng, X. C. Cao, J. Sun, B. Yuan, Q. H. Li, Z. Zhu, Y. Zhang, A vacuum pressure sensor based on ZnO nanobelt film, Nanotechnology, 22(2011), 495-501 (1-6).33、Y. Zhang, X. J. Zheng, T. Zhang, Characterization and humidity sensing properties of Bi0.5Na0.5TiO3-Bi0.5K0.5TiO3 powder synthesized by metal-organic decomposition, Sensors and Actuators B: Chemical, 156(2011), 887-892.34、J. Sun, X. J. Zheng, J. Cao, W. Li, Interface effects on the characteristics of metal-ferroelectric-insulator-semiconductor ?eld-effect transistor, Semicond. Sci. Technol., 26(2011), 093-097 (1-6).35、J. Sun, X. J. Zheng, Modeling of MFIS-FETs for the application of ferroelectric random access memory. IEEE Transactions on Electron Devices, 58(2011) 55-59.36、Z. Zhu, X. J. Zheng, D. D. Jiang, Z. C. Yang, The threshold electric field of 180° domain switching in the misfit strain-external electric field phase diagram. J. Appl. Phys, 110(2011), 032-035.37、H. Dong, X. J. Zheng, W. Li, Y. Q. Gong, J. F. Peng, Z. Zhu, The dielectric relaxation behavior of (Na0.82K0.18)0.5Bi0.5TiO3 ferroelectric thin film. J. Appl. Phys., 110(2011), 119-124.38、H. Zheng, X. J. Zheng, S. T. Song, J. Sun, F. Jiao, W. Liu, G. Y. Wang, Evaluation of the elastic modulus of thin film considering the substrate effect and geometry effect of indenter tip. Computational Materials Science, 50(2011), 26-30.39、Y. Zhang, X. J. Zheng, T. Zhang, J. Sun, Y. Bian, J. Song, Gas sensing properties of coral-like Bi0.5K0.5TiO3 powders synthesized by metal-organic decomposition. Meas. Sci. Technol. 22(2011), 195-205.40、J. Sun, X. J. Zheng, W. Yin, M. H. Tang, W. Li, Influences of space charge and electrode on the electrical transport through (Ba,Sr)TiO3 thin film capacitors. Applied Surface Science, 257(2011), 4990-4993.41、B. Yuan, X. J. Zheng, Y. Q. Chen, B. Yang, T. Zhang, High photosensitivity and low dark current of photoconductive semiconductor switch based on ZnO single nanobelt, Solid-State Electronics, 55(2011), 49-53.42、Y. Q. Chen, Y. F. En, Y. Huang, X. D. Kong, X. J. Zheng, and Y. D. Lu, Effects of surface tension and axis stress on piezoelectric behaviors of ferroelectric nanowires. Applied Physics Letters, 99, (2011), 203106-203108 (SCI源刊,影響因子3.726)43、Y. Q. Chen, Y. F. En, Y. Huang, X. D. Kong, W. X. Fang, and X. J. Zheng, Effects of Stress and Depolarization on Electrical Behaviors of Ferroelectric Field-Effect Transistor. IEEE ELECTRON DEVICE LETTERS, 99,(2011), 1-3(SCI源刊,影響因子2.714)44、H. Zheng, X. J. Zheng, J. S. Wang, G. C. Yu, Y. Li, S. T. Song, C. Han, Evaluation the effect of aspect ratio for Young’s modulus of nanobelt using finite element method. Materials and design, 32,(2011), 1407-1413 (SCI源刊,影響因子1.518)45、J. Sun, X. J. Zheng, W. Yin, M. H. Tang, W. Li, Space-charge-limited leakage current in high dielectric constant and ferroelectric thin films considering the field-dependent permittivity. Appl. Phys. Lett., 97.24 (2010): 242905 (SCI源刊,影響因子3.726)46、H. Zheng, X. J. Zheng, J. S. Wang, G. C. Yu, Y. Li, S. T. Song, C. Han, Evaluation the effect of aspect ratio for Young’s modulus of nanobelt using finite element method. Materials and design, 32.3 (2011): 1407-1413 (SCI源刊,影響因子1.518)47、B. Yuan,X. J. Zheng, Y. Q. Chen, B. Yang, T. Zhang, High photosensitivity and low dark current of photoconductive semiconductor switch based on ZnO single nanobelt. Solid-State Electronics, 55, (2011), 49-53. (SCI源刊,影響因子1.422)48、Y. Q. Chen, X. J. Zheng, W. Li, Modeling of flexoelectric effect on capacitor-voltage and memory window of metal-ferroelectric-insulator-silicon capacitor. Appl. Phys. Lett., 96, (2010), 233501 (1-3) (SCI源刊,影響因子3.726)49、X. J. Zheng, G. C Yu, Y. Q. Chen, S. X. Mao, T. Zhang, Photoinduced stiffening and photoplastic effect of ZnS individual nanobelt in nanoindentation. J. Appl. Phys., 108, (2010), 094305. (SCI源刊,影響因子2.497)50、X. J. Zheng, Q. Y. Wu, J. F. Peng, L. He, X. Feng, Y. Q. Chen, D. Z. Zhang, Annealing temperature dependence of effective piezoelectric coefficients for Bi3.15Eu0.85Ti3O12 thin films. J. Mater. Sci., 45, (2010), 3001-3006. (SCI源刊,影響因子1.181)51、X. J. Zheng, J. F. Peng, Y. Q. Chen, L. He, X. Feng, D. Z. Zhang, L. J. Gong, Q. Y. Wu, Enhancement on effective piezoelectric coefficient of Bi3.25Eu0.75Ti3O12 ferroelectric thin films under moderate annealing temperature. Thin Solid Films, 519,(2010), 714-718. (SCI源刊,影響因子1.884)52、D. Z. Zhang, X. J. Zheng, X. Feng, T. Zhang, J. Sun, S. H. Dai, L .J. Gong, Y. Q. Gong, L. He, Z. Zhu, J. Huang, X. Xu, Ferro-piezoelectric properties of 0.94(Na0.5Bi0.5)TiO3–0.06BaTiO3 thin film prepared by metal–organic decomposition. Journal of Alloys and Compounds, 504,(2010), 129-133. (SCI源刊,影響因子2.135)53、J. S. Wang, X. J. Zheng , H. Zheng, S. T. Song, Z. Zhu, Identification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis. Computational Materials Science, 49,(2010), 378-385. (SCI源刊,影響因子1.522)54、Y. Q. Chen, X. J. Zheng, W. Li,Size effect of mechanical behavior for lead-free(Na0.82K0.18)0.5Bi0.5TiO3 nanofibers by nanoindentation. Materials Science and Engineering A, 527.21 (2010): 5462-5466. (SCI源刊,影響因子1.806)55、Y. Q. Chen, X. J. Zheng, X. Feng, The fabrication of vanadium-doped ZnO piezoelectric nanofiber by electrospinning. Nanotechnology, 21,(2010), 055708. (SCI源刊,影響因子3.446)56、X. J. Zheng, Y. Q. Chen, T. Zhang, B. Yang, C. B. Jiang, B. Yuan, Z. Zhu, Photoconductive semiconductor switch based on ZnS nanobelts film. Sensors and Actuators B., 147,(2010) , 442-446 (SCI源刊,影響因子3.122)57、Y. Zhang, X. J. Zheng, T. Zhang, L. J. Gong, S. H. Dai, Y. Q. Chen, Humidity sensing properties of the sensor based on Bi0.5K0.5TiO3 powder. Sensors and Actuators B., 147,(2010), 180-184 (SCI源刊,影響因子3.122)58、X. J. Zheng, Y. Q. Chen, T. Zhang, C. B. Jiang, B. Yang, B. Yuan, S. X. Mao, W. Li, A photoconductive semiconductor switch based on an individual ZnS nanobelt. Scripta Materialia, 62,(2010), 520-523 (SCI源刊,影響因子2.887)59、Y. Q. Chen, X. J. Zheng, S. X. Mao, W. Li, Nanoscale mechanical behavior of vanadium doped ZnO piezoelectric nanofiber by nanoindentation technique. J. Appl. Phys., 107,(2010), 094302 (1-5) (SCI源刊,影響因子2.497)60、Y. Q. Chen, X. J. Zheng, X. Feng, S. H. Dai, D. Z. Zhang, Fabrication of lead-free (Na0.82K0.18)0.5Bi0.5TiO3 piezoelectric nanofiber by electrospinning. Materials Research Bulletin, 45,(2010), 717-721 (SCI源刊,影響因子1.812)61、X. J. Zheng, Y. F. Rong, D. Z. Zhang, T. Zhang, L. He, X. Feng, Enhancement on effective piezoelectric coefficient d33 of Bi3.15Dy0.85Ti3O12 ferroelectric thin films. Materials Letters, 64,(2010), 618-621 (SCI源刊,影響因子1.748)62、J. S. Wang, X. J. Zheng, H. Zheng, Z.Zhu, S. T. Song, Evaluation of the substrate effect on indentation behavior of film/substrate system. Applied Surface Science, 256,(2010), 3316-3320 (SCI源刊,影響因子1.576)63、Z. Zhu, X. J. Zheng, W. Li, Multilayer growth of BaTiO3 thin films via pulsed laser deposition: An energy-dependent kinetic Monte Carlo simulation. Applied Surface Science, 256,(2010), 5876-5881 (SCI源刊,影響因子1.576)64、X. J. Zheng, S. H. Dai, X. Feng, T. Zhang, D. Z. Zhang, Y. Q. Gong, Y. Q. Chen, L. He, Structural and electrical properties of (Na0.85K0.15)0.5Bi0.5TiO3 thin films deposited on LaNiO3 and Pt bottom electrodes. Applied Surface Science, 256,(2010), 3316-3320 (SCI源刊,影響因子1.576)65、Y. Q. Chen, X. J. Zheng, L. He, X. Feng, Annealing temperature-dependent piezoelectric properties of Bi3.15Nd0.85Ti3O12 ferroelectric thin films. Phys. Status Solidi A, 207,(2010), 1240-1244 (SCI源刊,影響因子1.205)66、Y. Q. Gong, X. J. Zheng, L. J. Gong, Y. Ma, D. Z. Zhang, S. H. Dai, X. J. Li, Effects of annealing temperature on microstructure and ferroelectric properties of Bi0.5(Na0.85K0.15)0.5TiO3 thin films. Trans. Nonferrous Met. Soc.China, 20,(2010), 1906-1910. (SCI源刊,影響因子0.321)67、H. P. Hu, S. H. Dai, X. J. Zheng, Y. C. Zhou, X. Feng, D. Z. Zhang, L. He, Thermal and piezoelectric properties of Bi3.15Nd0.85Ti3O12 thin film prepared by metal organic decomposition. Trans. Nonferrous Met. Soc.China, 20,(2010), 1424-1428. (SCI源刊,影響因子0.321)68、X. J. Zheng, B. Yang , T. Zhang, C. B. Jiang, S. X. Mao, Y. Q. Chen, B. Yuan, Enhancement in ultraviolet optoelectronic performance of photoconductive semiconductor switch based on ZnO nanobelts. Appl. Phys. Lett., 95,(2009), 221106 (1-3) (SCI源刊,影響因子4. 308)69、Z. Zhu, X. J. Zheng, W. Li, Submonolayer growth of BaTiO3 thin film via pulsed laser deposition: A kinetic Monte Carlo simulation. J. Appl. Phys., 106, (2009), 054105. (SCI源刊,影響因子2.497)70、Y. Q. Chen, X. J. Zheng, X. Feng, D. Z. Zhang, S. H. Dai, Lead-free piezoelectric (Na0.5Bi0.5)0.94TiO3–Ba0.06TiO3 nanofiber by electrospinning. Phys. Status Solidi RRL., 3, (2009), 290-292 (SCI源刊,影響因子2.147)71、X. J. Zheng, W. Yin, T. Zhang, Y. Q. Chen, M. H. Tang, J. Sun, Effect of the abnormal electric field induced by the passive layer on imprint failures of ferroelectric capacitors. Phys. Status Solidi RRL., 3, (2009), 251-253 (SCI源刊,影響因子2.147)72、B. Wu, X. J. Zheng, H. P. Hu, D. H. Li, Y. Ma, Y. C. Zhou, Near tip stress intensity factor for an edge-crack in a Pb(ZrxTi1-x)O3 thin ?lm with 90° domain switching under a continuous laser irradiation. Engineering Fracture Mechanics, 76,(2009), 1811-1821 (SCI源刊,影響因子1.713)73、D. H. Li, X. J. Zheng, B. Wu, Y. C. Zhou, Fracture analysis of a surface through-thickness crack in PZT thin film under a continuous laser irradiation. Engineering Fracture Mechanics, 76,(2009), 525-532 (SCI源刊,影響因子1.713)74、J. J. Zhang, J. Sun, X. J. Zheng, A model for the C-V characteristics of the metal–ferroelectric–insulator–semiconductor structure. Solid-State Electronics, 53, (2009), 170-175 (SCI源刊,影響因子1.259)75、R. Wang, Y. He, T. Zhang, Z. Wang, X. J. Zheng, L. Niu, DC and AC analysis of humidity sensitive properties based on K+ doped nanocrystalline LaCo0.3Fe0.7O3. Sensors and Actuators B: Chemical. 136,(2009), 536-540 (SCI源刊,影響因子3.122)76、Q. Qi, T. Zhang, L. Liu, X. J. Zheng, Synthesis and toluene sensing properties of SnO2 nano?bers. Sensors and Actuators B: Chemical. 137,(2009), 471-475 (SCI源刊,影響因子3.122)77、Q. Qi, T. Zhang, S. Wang, X. J. Zheng, Humidity sensing properties of KCl-doped ZnO nanofibers with super-rapid response and recovery. Sensors and Actuators B: Chemical. 137,(2009), 649-655 (SCI源刊,影響因子3.122)78、Q. Qi, T. Zhang, X. J. Zheng, L. Wan. Preparation and humidity sensing properties of Fe-doped mesoporous silica SBA-15. Sensors and Actuators B: Chemical. 135,(2008), 255-261 (SCI源刊,影響因子3.122)79、Q. Qi, T. Zhang, L. Liu, X. J. Zheng,, Q. Yu, Y. Zeng, et al. Selective acetone sensor based on dumbbell-like ZnO with rapid response and recovery. Sensors and Actuators B: Chemical. 134,(2008), 166-170 (SCI源刊,影響因子3.122)80、Q. Qi, T. Zhang, X. J. Zheng, H. Fan, L. Liu, R. Wang, et al. Electrical response of Sm2O3-doped SnO2 to C2H2 and effect of humidity interference. Sensors and Actuators B: Chemical. 134, (2008), 36-42 (SCI源刊,影響因子3.122)81、X. J. Zheng, J. Sun, J. J. Zhang, M. H. Tang, W. Li, Evaluation of capacitance-voltage characteristic and memory window of metal-ferroelectric-insulator-silicon capacitors. Appl. Phys. Lett., 93,(2008), 213501 (1-3) (SCI源刊,影響因子4. 308)82、Z. Zhu, X. J. Zheng, W. Li, Kinetic Monte Carlo simulation of RHEED from BaTiO3 thin films. Physica B, 403,(2008), 4074-4078 (SCI源刊,影響因子0. 908)83、F. Yang, M. H. Tang, Y. C. Zhou, F. Liu, Y. Ma, X. J. Zheng et al. Fatigue mechanism of the ferroelectric perovskite thin films. Appl. Phys. Lett. 92(2) (2008), 022908(1-3). (SCI源刊,影響因子4.127)84、L. P. Tang, S. H. Xie, X. J. Zheng, et al. Domain switching in ferroelectric ceramics beyond Taylor bound. Mechanics of Materials 40(2008), 362-376. (SCI源刊,影響因子2.106)85、X. J. Zheng, L. He, M. H. Tang, Y. Ma, J. B. Wang, Q. M. Wang. Enhancement of fatigue endurance and retention characteristic in Bi3.25Eu0.75Ti3O12 thin film. Materials Letters 62 (2008), 2876-2879. (SCI源刊,影響因子1.353)86、X. J. Zheng Y. G. Lu, L. He, Y. Q. Gong.Nanoscale domain switching in Bi3.15Eu0.85Ti3O12 thin films annealed at different temperature by scanning probe microscopy. Materials Letters 62 (2008), 440-442 (SCI源刊,影響因子1.353)87、Z. Ye, M. H. Tang, Y. C. Zhou, X. J. Zheng Modeling of imprint in hysteresis loop of ferroelectric thin films with top and bottom interface layers. Appl. Phys. Letts, 90 (2007), 042902 (1-3) (SCI源刊,影響因子4.127)88、F. Yang, M. H. Tang, Y. C. Zhou, X. J. Zheng, F. Liu, J. X. Tang, J. J. Zhang, J. Zhang, and Chang Q. Sun A model for the polarization hysteresis loops of the perovskite-type ferroelectric thin films. Appl. Phys. Letts, 91 (2007), 142902 (SCI源刊,影響因子4.127)89、Z. Ye, M. H. Tang, Y. C. Zhou, X. J. Zheng Electrical properties of V-doped Bi3.15Nd0.85Ti3O12 thin films with different contents. Appl. Phys. Letts, 90 (2007), 082905 (1-3) (SCI源刊,影響因子4.127)90、J. Zhang, M. H. Tang, J. X. Tang, F. Yang, H. Y. Xu, W. F. Zhao, X. J. Zheng, Y. C. Zhou, and J. He Bilayer model of polarization offset of compositionally graded ferroelectric thin films. Appl. Phys. Letts, 91 (2007), 162908 (1-3) (SCI源刊,影響因子4.127)91、X. L. Zhong, J. B. Wang, L. Z. Sun, C. B. Tan, X. J. Zheng, and Y. C. Zhou Improved ferroelectric properties of bismuth titanate films by Nd and Mn cosubstitution. Appl. Phys. Lett., 90(1), (2007), 012906 (1-3) (SCI源刊,影響因子4.127)92、F. Yang, M. H. Tang, Z. Ye, Y. C. Zhou, X. J. Zheng, J. X. Tang, J. J. Zhang and J. He Eight logic states of tunneling magneto-electroresistance in multiferroic tunnel junctions. Journal of Applied Physics, 102 (2007), 044504(1-5) (SCI源刊,影響因子2.497)93、X. J. Zheng, et al. The Effects of annealing temperature on the properties of Bi3.15Nd0.85 Ti3O12 thin films. Scripta Materialia 57 (2007) 675-678 (SCI源刊,影響因子2.112)94、M. H. Tang, Y. C. Zhou, X. J. Zheng. Electrical Properties of Metal-Ferroelectric -Insulator-Semiconductor Capacitors using Pt/ (Bi3.15Nd0.85)(Ti3-xVx)O12/Y2O3/Si Structure. Integrated Ferroelectrics, 94 (2007), 105-114(SCI源刊,影響因子0.427)95、M. H. Tang, Y. C. Zhou, X. J. Zheng. Structural and electrical properties of metal-ferroelectric-insulator-semiconductor transistors using a Pt/Bi3.25Nd0.75Ti3O12/Y2O3/Si structure. Solid State Electronics, 51 (2007), 371-375(SCI源刊,影響因子1.210)96、C. P. Cheng, M.H. Tang, Z. Ye, X. L. Zhong, X. J. Zheng, Y. C. Zhou, Z. S. Hu Structure evolution and ferroelectric properties of Bi3.4Yb0.6Ti3O12 thin films crystallized under a moderate temperature. Materials Letters, 61 (2007), 3563 (SCI源刊,影響因子1.353)97、C. P. Cheng, M. H. Tang, Z. Ye, Y. C. Zhou, X. J. Zheng Microstructure and ferroelectric properties of dyprosia-doped bismuth titanate thin films. Materials Letters, 61 (2007), 4117-4120(SCI源刊,影響因子1.353)98、X. J. Zheng, J. J. Zhang, Y. C. Zhou, Y. Q. Chen, Y. Bo Simulation of electric properties of MFIS capacitor with BNT ferroelectric thin film using Silvaco/Atlas. Trans. Nonferrous Met. Soc.China17(s1), (2007), 752-755(SCI源刊,影響因子0.277)99、X. J. Zheng, B. Yang, Z. Zhu, B. Wu, Y. L. Mao Kinetic Monte Carlo Simulation of the Growth of BaTiO3 Thin Film via Pulsed Laser Deposition. Trans. Nonferrous Met. Soc.China17(6), (2007), 1441-1446(SCI源刊,影響因子0.277)100、X. J. Zheng, J.Lu, Y. C. Zhou, B. Wu, Y. Q. Chen.Evolution of the domain structure and the frequency effect on the ferroelectric properties in BIT ferroelectrics. Trans. Nonferrous Met. Soc.China17(s1), (2007), 64-68(SCI源刊,影響因子0.277)101、X. J. Zheng, L. P. Tang, Q. Y. Wu, B. Wu.Evaluation of the effective elastic constants for polycrystalline PZT thin films by XRD patterns and pole figures. Journal of Central South University of Technology. 14(s1), (2007), 130-134(SCI源刊,影響因子0.277)102、J. X. Tang, M. H. Tang, F. Yang, J. J. Zhang, Y. C. Zhou, and X. J. Zheng A temperature-dependent model for kink effect of partially depleted SOI MOSFETs. Journal of Functional Materials, 38 (2007), 872-877103、X. J. Zheng, L. He, Y. C. Zhou, M. H. Tang. Effects of europium content on the microstructural and ferroelectric properties of Bi(4?x)EuxTi3O12 thin films. Appl. Phys. Lett. (2006), 89: 252908 (1-3) (SCI源刊,影響因子4.127)104、Z. Ye, M. H. Tang, C. P. Cheng, Y. C. Zhou, X. J. Zheng, Z. S. Hu. Simulation of polarization and butterfly hysteresis loops in bismuth layer-structured ferroelectric thin films. J. Appl. Phys. 100(2006), 094-101. (SCI源刊,影響因子2.497)105、M. H. Tang, Y. C. Zhou, X. J. Zheng, Z. Yan, C. P. Cheng, Z. Ye, Z. S. Hu. Characterization of ultra-thin Y2O3 films as insulator of MFISFET structure. Trans. Nonferrous Met. SOC. China 16(2006), 63-66. (SCI源刊,影響因子0.277)106、C. P. Cheng, M. H. Tang, Z. Ye, Y. C. Zhou, X. J. Zheng. Ferroelectric properties of dysprosium-doped Bi4Ti3O12 thin films crystallized in various atmospheres. Trans. Nonferrous Met. SOC. China 16(2006), 33-36. (SCI源刊,影響因子0.277)107、Z. Ye, M. H. Tang, C. P. Cheng,Y. C. Zhou, X. J. Zheng, Z. S. Hu. Effect of annealing temperature on ferroelectric properties of (Bi, Nd)4(Ti,V)3O12 thin films. Trans. Nonferrous Met. SOC. China 16(2006), 71-74. (SCI源刊,影響因子0.277)108、X. Tan, Y. C. Zhou and X. J. Zheng. Pulsed-laser deposition of polycrystalline Ni films: a three-dimensional kinetic Monte Carlo simulation, Surface Sci.,588(1-3) (2005), 175-183 (SCI源刊,影響因子2.168)109、X. J. Zheng and Y. C. Zhou, Investigation of an anisotropic plate model to evaluate the interface adhesion of thin film with cross-sectional nanoindentation method, Composites Sci. Tech., (2005),1382-1390 (SCI源刊,影響因子1.783)110、X. L. Zhong, J. B. Wang, Y. C. Zhou, J. J. Liu, X. J. Zheng, Electrical properties of Nd-substrated Bi4Ti3O12 thin films fabricated by chemical solution deposition, J. Crystal Growth, 277 (1-4),(2005), 233-237 (SCI源刊,影響因子1.707)111、X. Tan, X. J. Zheng and Y. C. Zhou, Dependence of morphology of pulsed-laser deposited coatings on temperature: a kinetic Monte Carlo simulation, Surface and Coating Technology, 197(2-3), (2005), 288-293 (SCI源刊,影響因子1.432)112、X. Tan, Y. C. Zhou, and X. J. Zheng, Comparison of island formation between pulsed laser deposition and molecular beam epitaxy, Surface review and letters, 12(2005), 611- 617 (SCI源刊,影響因子0.675 )113、X. J. Zheng, J. Y. Li and Y. C. Zhou. X-ray diffraction measurement of residual stress in PZT thin films prepared by pulsed laser deposition. Acta Mater., 52,(2004), 3313-3322. SCI影響因子3.059114、X. J. Zheng, S. F. Deng, Y. C. Zhou, X. Tan. Plate model to evaluate interfacial adhesion of anisotropy thin film in CSN test. Journal of Materials Science. 2004,39(12), 4013-4016. SCI影響因子0.826115、X. L. Zhong, X. J. Zheng, J. T. Yang. Dependence of Ba(Zr0.1Ti0.9)O3 films growth on substrate temperature upon radio-frequency plasma enhanced pulsed laser deposition, Journal of Crystal Growth, 271(1-2)(2004),216-222 (SCI源刊,影響因子1.707)116、X. L. Zhong, J. B. Wang, X. J. Zheng, Y. C. Zhou. Structure and ferroelectric and dielectric properties of Bi3.5Nd0.5Ti3O12 thin films under a moderate temperature annealing, Appl. Phys. Lett.,85(23)(2004), 5661-5663 (SCI源刊,影響因子4.127)117、S. F. Deng, X. J. Zheng, J. T.Yang.X-ray Diffraction Measurement of Residual Stress in PZT Thin Films Prepared by MOD with the New Extended Model. Journal of Materials Science and Technology, 52.11 (2004), 3313-3322 (SCI源刊,影響因子0.329)118、X. J. Zheng, Y. C. Zhou and J. Y. Li. Nano-indentation fracture test of Pb(Zr0.52Ti0.48)O3 ferroelectric thin films. Acta Mater., 51, (2003), 3985-3997. SCI影響因子3.059119、X. J. Zheng, Y. C. Zhou, H. Zhong. Dependence of fracture toughness on annealing temperature in PZT thin films produced by metal organic decomposition. Journal of Materials Research, 18(3), (2003), 578-584. SCI影響因子1.635120、X. J. Zheng, Z.Y.Yang and Y. C. Zhou. Residual stresses in Pb(Zr0.52Ti0.48)O3 thin films deposited by metal organic decomposition. Scripta Materialia, 49(1), (2003),71-76. SCI影響因子1.633121、X. J. Zheng, Y. C. Zhou, J. M. Liu and A. D. Li. Use of the nanomechanical fracture-testing for determining interfacial adhesion of PZT ferroelectrics thin films. Surface and Coating Technology, 176, (2003), 67-74. SCI影響因子1.410122、X. J. Zheng, Y. C. Zhou, J. M. Liu and A. D. Li. Determination of interfacial fracture energy of PZT ferroelectric thin films by nano-scratch technique. Journal of Materials Science Letters, 22(10) , (2003),743-745. SCI影響因子0.470123、X. J. Zheng, Y. C. Zhou,Z. Yan. Dependence of Crystalline, Ferroelectric and Fracture Toughness on Annealing in Pb(Zr0.52Ti0.48)O3 Thin Films Deposited by Metal Organic Decomposition. Materials Research, 6(4), (2003),551-556.124、Y. C. Zhou, Z. Y. Yang, X. J. Zheng. Residual stress in PZT thin films prepared by pulsed laser deposition. Surface and Coating Tech., 162(2-3), (2003),202-211. SCI影響因子1.410125、X. J. Zheng, Y. C. Zhou, M. Z. Nin. Thermopiezoelectric response of a piezoelectric thin film PZT-6B deposited on MgO (100) substrate due to a continuous laser. Int. J. Solid Structure, 39(15), (2002), 3935-3957. SCI影響因子1.327126、X. J. Zheng, Y. C. Zhou, J. M. Liu and A. D. Li. Interfacial adhesion analysis of Pb(Zr0.52Ti0.48)O3 ferroelectrics thin films by nano-indentation test. Phys Lett A, 304(3-4), (2002),110-113. SCI影響因子1.324127、Z. Y. Yang, Y. C. Zhou, X. J. Zheng, Z. Yan and G. Bignall. The determination of residual stress in PZT thin film prepared by pulsed laser deposition. Journal of Materials Science Letters, 21(19), (2002),1541-1544. SCI影響因子0.470

[教育背景]
以上老師的信息來(lái)源于學(xué)校網(wǎng)站,如有更新或錯(cuò)誤,請(qǐng)聯(lián)系我們進(jìn)行更新或刪除,聯(lián)系方式

添加湘潭大學(xué)學(xué)姐微信,或微信搜索公眾號(hào)“考研派小站”,關(guān)注[考研派小站]微信公眾號(hào),在考研派小站微信號(hào)輸入[湘潭大學(xué)考研分?jǐn)?shù)線、湘潭大學(xué)報(bào)錄比、湘潭大學(xué)考研群、湘潭大學(xué)學(xué)姐微信、湘潭大學(xué)考研真題、湘潭大學(xué)專業(yè)目錄、湘潭大學(xué)排名、湘潭大學(xué)保研、湘潭大學(xué)公眾號(hào)、湘潭大學(xué)研究生招生)]即可在手機(jī)上查看相對(duì)應(yīng)湘潭大學(xué)考研信息或資源。

湘潭大學(xué)考研公眾號(hào) 考研派小站公眾號(hào)
湘潭大學(xué)

本文來(lái)源:http://www.zhongzhouzhikong.com/xtu/yanjiushengdaoshi_540116.html

推薦閱讀